现行
BS EN IEC 60749-30:2020
到馆提醒
收藏跟踪
分享链接
购买正版
选择购买版本
本服务由中国标准服务网提供
更多
前往中国标准服务网获取更多购买信息
支持批量购买纸质版标准
Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing
半导体器件 机械和气候试验方法
IEC 60749的本部分建立了在可靠性测试之前确定非密封表面安装装置(SMD)预处理的标准程序。
该测试方法定义了代表典型工业多焊料回流操作的非密封固态SMD的预处理流程。
在提交给特定的内部可靠性测试(鉴定和/或可靠性监测)之前,这些SMD要经过本文件中描述的适当预处理顺序,以评估长期可靠性(受焊接应力影响)。购买本文件时可获得的所有当前修订均包含在购买本文件中。
This part of IEC 60749 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.
These SMDs are subjected to the appropriate preconditioning sequence described in this document prior to being submitted to specific in-house reliability testing (qualification and/or reliability monitoring) in order to evaluate long term reliability (impacted by soldering stress).All current amendments available at time of purchase are included with the purchase of this document.